The subject is aimed to help PhD students to understand better methods of reliability and availability improvement of SOC and NOC circuits built on FPGAs and ASICs.
faults failures defects test test generation BIST LFSR MISR reconfigurable circuits on-line testing dependability
Building blocks in FPGAs, their main fault mechanisms. External FPGA tests, their realization and embedding int the life cycle of the circuit. Embedded diagnostic in FPGAs, LSFR-based test generators, test result evaluation (embedded analyzers, MISR). Implementation of self-checked and self-tested in FPGAs. Selection of safety codes, design of a completely self-checked code checker. Conditions for automatic configuration after failure, the choice of type and size of interchangeable modules. Setting redundancy level in dependence on fault intensity and the required reliability parameters.
Students solve individual project. The project is chosen in such a way that it can help students to improve reliability and availability of their designs.
Novák, O, Gramatová, E., Ubar, R.: Handbook of Electronic Testing. Vydavatelství ČVUT, srpen 2005, ISBN 80-01-03318-X, 405 stran