Built-in Self-Test in Circuits with more than 10 Million Transistors
Hlavička, J.
HLAVIČKA, J. Built-in Self-Test in Circuits with more than 10 Million Transistors. [Research Report] Praha: ČVUT FEL, Katedra počítačů, 2000. Report no. DC-2000-04.
Hlavička, J.
HLAVIČKA, J. Built-in Self-Test in Circuits with more than 10 Million Transistors. [Research Report] Praha: ČVUT FEL, Katedra počítačů, 2000. Report no. DC-2000-04.